ZEISS Introduces Machine Learning Capability for Microscopy

First ZEN Intellesis Solution Enables Segmentation of Correlative Microscopy Datasets

11 December 2017, Oberkochen, Germany – Today ZEISS announces ZEN Intellesis, a new machine learning capability that enables researchers to perform advanced analysis of their imaging samples across multiple microscopy methods. The first algorithmic solution introduced by the ZEISS ZEN Intellesis platform makes integrated, easy to use, powerful segmentation for 2D and 3D datasets available to the routine microscopy user. ZEISS ZEN Intellesis software is available for the company’s full range of optical, confocal, X-ray, electron and ion microscopes.

ZEISS ZEN Intellesis allows users to train machine learning classifications on ZEISS image data sets as well as on any images readable by ZEN software for any ZEISS microscopes. It then applies that classifier across large, scaled datasets. It uniquely allows for multiple spatially registered datasets, acquired using correlative microscopy and classical image analysis tools, to be used in parallel during classification. ZEN Intellesis also works with 6D datasets, including multichannel 3D stacks or tile images.

Learn more about ZEISS ZEN Intellesis and download the free 30-day trial.