ZEISS Seminars at Neuroscience 2017
Charge Compensation by Focal Gas Injection Enables High-performance Serial Block-Face SEM on Non-conductive Samples
PLACEHOLDER FOR THE REGISTRATION FORM
PLACEHOLDER FOR THE REGISTRATION FORM
PLACEHOLDER FOR THE REGISTRATION FORM
Monday, November 13, 2017, 12:00 PM - 1:00 PM
Matthias Haberl, Center for Research in Biological Systems, University of California, San Diego, La Jolla, CA, USA
Serial block-face scanning electron microscopy (SBEM) is a powerful method delivering 3D brain volumes and propelling research into mapping the fine-scale connectome. In this session, we describe a new approach for completely eliminating sample charging while acquiring SBEM data at high vacuum. We will provide examples of high-resolution imaging of samples prone to charging, showing how our solution improves resolution and signal-to-noise without increasing data acquisition time. This advance will significantly expand the use of SBEM, in general, and allow for use of previously challenging samples. Since signal-to-noise is also enhanced, deep learning based segmentation becomes easier and larger connectomes can be assembled.