ZEISS Lunch and Learn at Microscopy & Microanalysis 2017
A Selection of Recent Developments using ZEISS Ion Beam Technologies

A selection of recent developments will be presented from the applications team of ZEISS Microscopy and from Fibics Incorporated and their colleagues, focusing on applications of the ZEISS Crossbeam and Orion NanoFab microscopes. Topics presented will include milling with large gallium beam currents, three dimensional tomography including FIB/SEM tomography ranging from the quarter millimeter length scale to the nanometer‎ voxel, three dimensional analytics, single high resolution imaging with precision beam placement enabled by the ZEISS Gemini column and associated technologies, large area imaging in SEM and STEM, high speed patterning showcasing one million complex patterns executed in about an hour and custom sectioning and imaging at high throughput.

Examples will be presented of the correlative workspace; this special graphical user interface of ZEISS Atlas 5 brings together multi-modal, multi-microscope analysis of the same specimen, including light, electron, ion and analytical microscopy techniques. A review of selected correlative X-ray microscopy to FIB/SEM microscopy examples adds to the portrait of ZEISS Crossbeam and ZEISS Atlas 5.