ZEISS Lunch and Learn at Microscopy & Microanalysis 2017
3D Confocal Raman Microscope integrated in SEM for Correlative Microscopy and Complementary Sample Knowledge

Field Emission Scanning Electron Microscopy (FESEM) and Raman spectral imaging deliver complementary sample information which helps scientists to gain complete and deep knowledges of their samples. The recent achievement in correlative microscopy is the full integration of WITec 3D confocal Raman microscope into ZEISS FESEMs. Out of it the new SIGMA 300 RISE enables the best-in-class SEM imaging of composite materials and directly links their chemical/molecular information in addition by means of confocal Raman Imaging (CRI) capabilities. The fast and precise sample transfer within the chamber and under vacuum per mouse click simplifies the correlative workflow and delivers crucial sample information from regions of interest (ROI) with pinpoint precision. In summary, the combination of superior SEM imaging and analysis approaches and CRI capabilities allows to identify molecules or non-metallic compounds at high resolution, even if these show the same stoichiometry. Examples from various fields of applications will be presented.